Force Modulation Microscopy is a scanning probe microscopy technique that maps the local mechanical properties of a sample by modulating the force applied between the probe tip and the surface at a high frequency and detecting the resulting amplitude and phase of the cantilever oscillation.
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178
Using force modulation to image surface elasticities with the atomic force microscope
P. Maivald, Hans‐Jürgen Butt, S. A. C. Gould et al. · Nanotechnology · 1991 · 519 citations
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Kyoto University
Kyoto, Japan
11 h-index
59 publications
3.3K citations
Japan Science and Technology Agency
Tokyo, Japan
10 h-index
19 publications
642 citations
The University of Tokyo
Tokyo, Japan
7 h-index
26 publications
907 citations
Centre National de la Recherche Scientifique
Paris, France
7 h-index
19 publications
520 citations
Kyoto Katsura Hospital
Kyoto, Japan
7 h-index
26 publications
1.8K citations
Kanazawa University
Kanazawa, Japan
6 h-index
12 publications
398 citations
National Institute of Advanced Industrial Science and Technology
Tsukuba, Japan
6 h-index
11 publications
186 citations
University of Maryland, College Park
College Park, United States
5 h-index
9 publications
258 citations
1–8 of 215
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- Applied Physics Letters
30 publications · 1.6K citations
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- Langmuir
12 publications · 652 citations
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- Nanotechnology
13 publications · 1.1K citations
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- Japanese Journal of Applied Physics
JJAP · 10 publications · 197 citations
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- Journal of Applied Physics
9 publications · 2.6K citations
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