Frequency domain analysis of analog single-event transients in linear circuits

Y. Boulghassoul, L. W. Massengill, T.L. Turflinger, W.T. Holman

IEEE Transactions on Nuclear Science · 2002 · 57 citations · 15 references

Concepts

Abstract

Using frequency-domain analysis techniques, a study of the relationship between the frequency spectrum of a single-event transient (SET) stimulus and the frequency response of internal circuit blocks of typical operational amplifier architectures has been performed. Results explain several general analog SET (ASET) observations, including the relative importance of the stimulus temporal profile, the circuit bandwidth, and the ion strike location relative to major circuit modules. Benefits gained from frequency compensation are evident, as important filtering of high-frequency signal components occur, reducing detrimental effects on the operation of the circuit.

References

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