2003 · 1.4K citations · 11 references
EngineeringComputer EngineeringComputer ScienceComputer ArchitectureMicroelectronicsSemiconductor DevicesApplication-specific Integrated CircuitsDevice ScalingIntegrated Circuit DesignMicroarchitecture DesignProcessor MicroarchitectureVoltage ScalingDevice Scaling EffectsProcess Variation ToleranceProcess Voltage Temperature Variation AnalysisScaling Effects In CmosTechnology ScalingVoltage Scaling For Process VariationVoltage Scaling In Digital CircuitsVoltage Scaling In Microprocessors
Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltage and temperature variations; and their impact on circuit and microarchitecture. Possible solutions to reduce the impact of parameter variations and to achieve higher frequency bins are also presented.
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Parameter variations and impact on circuits and microarchitecture
Shekhar Borkar, Tanay Karnik, S. Narendra et al. · 2003 · 1.4K citations
Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICs
A. Keshavarzi, Shuo Ma, S. Narendra et al. · 2001 · 178 citations