Process Variation Tolerance

Process Variation Tolerance is a design-level attribute in near-threshold computing that characterizes a system’s resilience to parametric deviations in manufacturing processes by maintaining correct functionality and performance despite variations in transistor-level electrical properties.

490

Publications

22.3K

Citations

1.6K

Authors

345

Institutions

Publications per year

2017–2026

Parents

Near-threshold Computing

Publications

490

Parameter variations and impact on circuits and microarchitecture

Shekhar Borkar, Tanay Karnik, S. Narendra et al. · 2003 · 1.4K citations

Engineering, Computer Engineering, Computer Science +17

RazorII: In Situ Error Detection and Correction for PVT and SER Tolerance

Shidhartha Das, Carlos Tokunaga, Sanjay Pant et al. · IEEE Journal of Solid-State Circuits · 2009 · 585 citations

Engineering, Computer Engineering, Electrical Engineering +17

High-performance CMOS variability in the 65-nm regime and beyond

K. Bernstein, D.J. Frank, Anne Gattiker et al. · IBM Journal of Research and Development · 2006 · 557 citations

Engineering, Computer Engineering, Electrical Engineering +17

A 160 mV Robust Schmitt Trigger Based Subthreshold SRAM

Jaydeep P. Kulkarni, Keejong Kim, Kaushik Roy · IEEE Journal of Solid-State Circuits · 2007 · 479 citations

Engineering, Computer Engineering, Electrical Engineering +16

FreePDK: An Open-Source Variation-Aware Design Kit

James E. Stine, Ivan D. Castellanos, Michael Wood et al. · 2007 · 429 citations

Engineering, Computer Engineering, Digital Design +17

1–5 of 490

Authors

1.6K

KR
Kaushik Roy
Purdue University West Lafayette, United States
24 publications · 2.2K citations
20
h-index
VD
Vivek De
Intel (United States), United States
12 publications · 2.1K citations
11
h-index
SB
Shekhar Borkar
Intel (United States), United States
10 publications · 2K citations
10
h-index
DB
David Blaauw
University of Michigan, United States
10 publications · 1.3K citations
10
h-index
TK
Tanay Karnik
Intel (United States), United States
9 publications · 2K citations
9
h-index

1–5 of 1.6K

Institutions

345

1–8 of 345

Venues

IEEE Journal of Solid-State Circuits
22 publications · 2.6K citations
20
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
29 publications · 1.6K citations
19
h-index
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
16 publications · 580 citations
13
h-index
IEEE Transactions on Circuits and Systems I Regular Papers
11 publications · 363 citations
11
h-index
IEEE Transactions on Electron Devices
11 publications · 626 citations
10
h-index

1–5