Concepedia

Publication | Closed Access

Preliminary results of storage accelerated aging test on InP/InGaAs DHBT

DOI

11

Citations

6

References

2010

Year

G. A. Koné, B. Grandchamp, C. Hainaut, François Marc, Cristell Maneux, N. Labat, Thomas Zimmer, Virgini Nodjiadjim, J. Godin
Microelectronics Reliability

References

YearCitations

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