Preliminary results of storage accelerated aging test on InP/InGaAs DHBT

G. A. Koné, B. Grandchamp, C. Hainaut, François Marc, Cristell Maneux, N. Labat, Thomas Zimmer, Virgini Nodjiadjim, J. Godin

Microelectronics Reliability · 2010 · 11 citations · 6 references

Concepts

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