Microelectronics Reliability · 2010 · 11 citations · 6 references
EngineeringMaterials ScienceAgingElectronic MaterialsSemiconductor DevicesSemiconductor ReliabilityStorage ConditionsStorage EngineeringStorage ReliabilityStorage TechnologyAccelerated Aging TestsAccelerated Degradation TestingAging CharacterizationAging TestsPreliminary Investigation
6