G. A. Koné - Concepedia

Author

G. A. Koné

Also Known As

A. Koné, G., G. A. Kone, G. A. Koné, G.A. Kone, G.A. Koné, Gilles A. Kone, Kone, Gilles Amadou, Koné, G.A, Koné, G.A., Koné, Gilles Amadou

Publications

Citations

H-Index

Concepts

All Affiliations

G. A. Koné is an author at III V Lab specializing in electrical engineering, engineering, and applied physics.

#	Concept	H-Index	Publications	Citations
1	Engineering	4	4	47
2	Applied Physics	3	3	36
3	Education	1	1	11
4	Medicine	1	1	11
5	Computer Engineering	1	1	11

G. A. Koné

Publications

Citations

H-Index

Page 1

	Year	Citations
Trends in Submicrometer InP-Based HBT Architecture Targeting Thermal Management B. Grandchamp, Virginie Nodjiadjim, M. Zaknoune, IEEE Transactions on Electron Devices Electrical EngineeringEngineeringAdvanced Packaging (Semiconductors)NanoelectronicsBias Temperature Instability	2011	15
Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses G. A. Koné, C. Hainaut, Cristell Maneux, Microelectronics Reliability	2011	11
Submicrometer InP/InGaAs DHBT Architecture Enhancements Targeting Reliability Improvements G. A. Koné, B. Grandchamp, C. Hainaut, IEEE Transactions on Electron Devices EngineeringMeasurementEducationSemiconductor DeviceEmitter Access Resistance	2013	11
Preliminary results of storage accelerated aging test on InP/InGaAs DHBT G. A. Koné, B. Grandchamp, C. Hainaut, Microelectronics Reliability Electrical EngineeringEngineeringAgingStorage SystemsLongevity	2010	11
Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design Sudip Ghosh, B. Grandchamp, G. A. Koné, Microelectronics Reliability Electrical EngineeringBias Stress ConditionsEngineeringRf SemiconductorCircuit Design	2011	10
Advancements on reliability-aware analog circuit design Bertrand Ardouin, Jean-Yves Dupuy, J. Godin,	2012	10

Page 1