Concepedia

Publication | Closed Access

Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses

DOI

11

Citations

3

References

2011

Year

G. A. Koné, C. Hainaut, Cristell Maneux, Thomas Zimmer, Virginie Nodjiadjim
Microelectronics Reliability

References

YearCitations

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