Reliability Physics is a scientific discipline that investigates the fundamental mechanisms and physical laws governing the degradation and failure processes of devices, distinguishing itself by integrating materials science, stress physics, and statistical modeling to predict and enhance device longevity under operational conditions.
490
Publications
17.1K
Citations
1.5K
Authors
417
Institutions
Publications per year
2017–2026
78
Variants
Physics Of Failure
Parents
Publications
490
1–5 of 490
Authors
1.5K
- GG
9
h-index
- CH
9
h-index
- EY
7
h-index
- BK
7
h-index
- ES
7
h-index
1–5 of 1.5K
Institutions
417
IBM (United States)
Armonk, United States
18 h-index
59 publications
3.6K citations
IMEC
Leuven, Belgium
16 h-index
143 publications
3.8K citations
Intel (United States)
Santa Clara, United States
13 h-index
59 publications
3.4K citations
Infineon Technologies (Germany)
Munich, Germany
12 h-index
31 publications
1.7K citations
University of California, Berkeley
Berkeley, United States
11 h-index
32 publications
1.1K citations
University of Maryland, College Park
College Park, United States
11 h-index
23 publications
1.3K citations
KU Leuven
Leuven, Belgium
10 h-index
22 publications
537 citations
Centre National de la Recherche Scientifique
Paris, France
10 h-index
21 publications
523 citations
1–8 of 417
Venues
- Microelectronics Reliability
57 publications · 1.6K citations
23
h-index
- IEEE Transactions on Electron Devices
20 publications · 701 citations
16
h-index
- IEEE Transactions on Device and Materials Reliability
15 publications · 608 citations
13
h-index
- Journal of Applied Physics
13 publications · 666 citations
12
h-index
- IEEE Transactions on Reliability
11 publications · 390 citations
11
h-index
1–5