Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design

Submicron InP DHBT Technology for High-Speed High-Swing Mixed-Signal ICs

J. Godin, Virginie Nodjiadjim, M. Riet et al. · Technical digest -- IEEE Compound Semiconductor Integrated Circuit Symposium · 2008 · 73 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +15

Improvement of Aging Simulation of Electronic Circuits Using Behavioral Modeling

B. Mongellaz, Corinne Bestory, H. Lévi et al. · IEEE Transactions on Device and Materials Reliability · 2006 · 21 citations

Engineering, Electrical Engineering, Aging +16

Gold diffusion in InP

V. Parguel, P.N. Favennec, M. Gauneau et al. · Journal of Applied Physics · 1987 · 19 citations

Natural Sciences, Materials Science, Physics +17

Preliminary results of storage accelerated aging test on InP/InGaAs DHBT

G. A. Koné, B. Grandchamp, C. Hainaut et al. · Microelectronics Reliability · 2010 · 11 citations

Engineering, Materials Science, Aging +12

Impact of surface traps on downscaled InP/InGaAs DHBTs

J.M. Ruiz-Palmcro, H. Jäckel · 2005 · 11 citations

Engineering, Electrical Engineering, Materials Science +17