Concepedia

Thomas Zimmer

TZ

Statistics

Publications

5

Citations

76

H-Index

5

Active since

2003

Affiliations

Université de Bordeaux(Current)

Institut Polytechnique de Bordeaux

Laboratoire de l'Intégration du Matériau au Système

Thales (France)

Centre National de la Recherche Scientifique

Thomas Zimmer is an author at Université de Bordeaux specializing in semiconductor devices, engineering, and electrical engineering.

Publications per year

2003–2019

5

Publications

5

Microscopic Hot-Carrier Degradation Modeling of SiGe HBTs Under Stress Conditions Close to the SOA Limit

Hamed Kamrani, Dominic Jabs, Vincenzo d’Alessandro et al. · IEEE Transactions on Electron Devices · 2017 · 25 citations

Engineering, Electrical Engineering, Materials Engineering +17

Trends in Submicrometer InP-Based HBT Architecture Targeting Thermal Management

B. Grandchamp, Virginie Nodjiadjim, M. Zaknoune et al. · IEEE Transactions on Electron Devices · 2011 · 15 citations

Engineering, Electrical Engineering, Materials Science +17

Modeling the self-heating effect in SiGe HBTs

Hassène Mnif, Thomas Zimmer, Jean‐Luc Battaglia et al. · 2003 · 14 citations

Engineering, Electrical Engineering, Materials Science +17

Preliminary results of storage accelerated aging test on InP/InGaAs DHBT

G. A. Koné, B. Grandchamp, C. Hainaut et al. · Microelectronics Reliability · 2010 · 11 citations

Engineering, Materials Science, Aging +12

Analysis of a failure mechanism occurring in SiGe HBTs under mixed-mode stress conditions

Mathieu Jaoul, D. Ney, Didier Céli et al. · 2019 · 11 citations

Engineering, Electrical Engineering, Materials Science +17

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