Statistics
Publications
6
Citations
185
H-Index
6
Active since
2006
N. Labat is an author at Université de Bordeaux specializing in semiconductor devices, engineering, and wide band gap semiconductors.
Publications per year
2006–2017
6
6
Preliminary results of storage accelerated aging test on InP/InGaAs DHBT
G. A. Koné, B. Grandchamp, C. Hainaut et al. · Microelectronics Reliability · 2010 · 11 citations
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