Statistics
Publications
6
Citations
94
H-Index
6
Active since
2002
François Marc is an author at Université de Bordeaux specializing in engineering, semiconductor reliability, and electrical engineering.
Publications per year
2002–2017
6
6
Preliminary results of storage accelerated aging test on InP/InGaAs DHBT
G. A. Koné, B. Grandchamp, C. Hainaut et al. · Microelectronics Reliability · 2010 · 11 citations
1–5 of 6