Materials Science and Engineering B · 2008 · 18 citations · 8 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsHigh-temperature PlasmasIon ImplantationLaser-plasma InteractionsSemiconductor Device MaterialsSemiconductor PhysicsSilicon MaterialsAnnealing Temperature EffectsBoron IncorporationLaser AnnealingPost-implantation AnnealingShallow Junction FormationSilicon AnnealingUltra-shallow Junction Engineering
8
Heat of crystallization and melting point of amorphous silicon
E. P. Donovan, F. Spaepen, David Turnbull et al. · Applied Physics Letters · 1983 · 328 citations
Natural Sciences, Materials Engineering, Materials Science +17
Boron uphill diffusion during ultrashallow junction formation
Ray Duffy, V. C. Venezia, A. Heringa et al. · Applied Physics Letters · 2003 · 71 citations