5
Publications
110
Citations
5
H-Index
1993
Active since
D. Zahorski is an author at Sopra (France) specializing in engineering, applied physics, and photonics.
Top concepts
EngineeringApplied PhysicsPhotonicsOptoelectronicsOptical PropertiesOptical CharacterizationPhysicsMicroscopyCalibrationSpectroscopy
Publications per year
1993–2003
5
5
Optical characterization of laser processed ultra-shallow junctions
G. Kerrien, Miguel Hernández, C. Laviron et al. · Applied Surface Science · 2003 · 28 citations
Single shot excimer laser crystallization and LPCVD silicon TFTs
Youri Helen, K. Mourgues, F. Raoult et al. · Thin Solid Films · 1999 · 21 citations
Spectroscopic ellipsometry: a new tool for “on line” quality control
D. Zahorski, J. L. Mariani, L. Escadafals et al. · Thin Solid Films · 1993 · 10 citations
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