K. Mourgues

Reliability study of power RF LDMOS device under thermal stress

M.A. Belaïd, K. Ketata, K. Mourgues et al. · Microelectronics Journal · 2006 · 38 citations

Engineering, Electrical Engineering, Aging +16

Analysis and Simulation of Self-Heating Effects on RF LDMOS Devices

M.A. Belaïd, K. Ketata, Hichame Maanane et al. · 2005 · 35 citations

Engineering, Electrical Engineering, Heat Transfer +16

High mobility thin film transistors by Nd:YVO4-laser crystallization

Youri Helen, R. Dassow, M. Nerding et al. · Thin Solid Films · 2001 · 30 citations

Engineering, Materials Engineering, Materials Science +11

Laser crystallization of silicon for high-performance thin-film transistors

R. Dassow, Jürgen Köhler, Youri Helen et al. · Semiconductor Science and Technology · 2000 · 26 citations

Engineering, Materials Engineering, Materials Science +17

Single shot excimer laser crystallization and LPCVD silicon TFTs

Youri Helen, K. Mourgues, F. Raoult et al. · Thin Solid Films · 1999 · 21 citations

Engineering, Materials Engineering, Materials Science +11