Hichame Maanane

Analysis and Simulation of Self-Heating Effects on RF LDMOS Devices

M.A. Belaïd, K. Ketata, Hichame Maanane et al. · 2005 · 35 citations

Engineering, Rf Ldmos Devices, Self Heating Effects +16

Physical analysis of Schottky contact on power AlGaN/GaN HEMT after pulsed-RF life test

Jean-Baptiste Fonder, L. Chevalier, Cécile Genevois et al. · Microelectronics Reliability · 2012 · 19 citations

Schottky Contact, Electrical Engineering, Engineering +8

Comparative analysis of accelerated ageing effects on power RF LDMOS reliability

M.A. Belaïd, K. Ketata, K. Mourgues et al. · Microelectronics Reliability · 2005 · 19 citations

Electrical Engineering, Reliability Engineering, Engineering +6

Study of RF N− LDMOS critical electrical parameter drifts after a thermal and electrical ageing in pulsed RF

Hichame Maanane, Malek Masmoudi, J. Marcon et al. · Microelectronics Reliability · 2005 · 18 citations

Electrical Engineering, Engineering, Rf Semiconductor +6

Compared deep class-AB and class-B ageing on AlGaN/GaN HEMT in S-Band pulsed-RF operating life

Jean-Baptiste Fonder, Olivier Latry, C. Duperrier et al. · Microelectronics Reliability · 2012 · 13 citations

Wide-bandgap Semiconductor, Class-b Ageing, Electrical Engineering +8