K. Ketata

Reliability study of power RF LDMOS device under thermal stress

M.A. Belaïd, K. Ketata, K. Mourgues et al. · Microelectronics Journal · 2006 · 38 citations

Engineering, Electrical Engineering, Aging +16

Analysis and Simulation of Self-Heating Effects on RF LDMOS Devices

M.A. Belaïd, K. Ketata, Hichame Maanane et al. · 2005 · 35 citations

Engineering, Electrical Engineering, Heat Transfer +16

Be diffusion mechanisms in InGaAs during post-growth annealing

S. Koumetz, J. Marcon, K. Ketata et al. · Applied Physics Letters · 1995 · 24 citations

Natural Sciences, Materials Engineering, Materials Science +17

Gate charge behaviors in N-channel power VDMOSFETs during HEF and PBT stresses

M. Alwan, B. Beydoun, K. Ketata et al. · Microelectronics Reliability · 2007 · 21 citations

Engineering, Electrical Engineering, Microelectronics +15

Bias temperature instability from gate charge characteristics investigations in N-Channel Power MOSFET

M. Alwan, B. Beydoun, K. Ketata et al. · Microelectronics Journal · 2007 · 20 citations

Engineering, Electrical Engineering, Microelectronics +16