M.A. Belaïd

Reliability study of power RF LDMOS device under thermal stress

M.A. Belaïd, K. Ketata, K. Mourgues et al. · Microelectronics Journal · 2006 · 38 citations

Analysis and Simulation of Self-Heating Effects on RF LDMOS Devices

M.A. Belaïd, K. Ketata, Hichame Maanane et al. · 2005 · 35 citations

Engineering, Rf Ldmos Devices, Self Heating Effects +16

Conducted and radiated EMI evolution of power RF N-LDMOS after accelerated ageing tests

Mohamed Tlig, Jaleleddine Ben Hadj Slama, M.A. Belaïd · Microelectronics Reliability · 2013 · 19 citations

Electrical Engineering, Engineering, Rf Semiconductor +6

Evaluation of hot-electron effects on critical parameter drifts in power RF LDMOS transistors

M.A. Belaïd, K. Daoud · Microelectronics Reliability · 2010 · 19 citations

Device Modeling, Electrical Engineering, Critical Parameter Drifts +8

Comparative analysis of accelerated ageing effects on power RF LDMOS reliability

M.A. Belaïd, K. Ketata, K. Mourgues et al. · Microelectronics Reliability · 2005 · 19 citations

Electrical Engineering, Reliability Engineering, Engineering +6