J. Marcon

Reliability study of power RF LDMOS device under thermal stress

M.A. Belaïd, K. Ketata, K. Mourgues et al. · Microelectronics Journal · 2006 · 38 citations

Analysis and Simulation of Self-Heating Effects on RF LDMOS Devices

M.A. Belaïd, K. Ketata, Hichame Maanane et al. · 2005 · 35 citations

Engineering, Rf Ldmos Devices, Self Heating Effects +16

Be diffusion mechanisms in InGaAs during post-growth annealing

S. Koumetz, J. Marcon, K. Ketata et al. · Applied Physics Letters · 1995 · 24 citations

Materials Engineering, Materials Science, Semiconductors +15

Comparative analysis of accelerated ageing effects on power RF LDMOS reliability

M.A. Belaïd, K. Ketata, K. Mourgues et al. · Microelectronics Reliability · 2005 · 19 citations

Electrical Engineering, Reliability Engineering, Engineering +6

Study of RF N− LDMOS critical electrical parameter drifts after a thermal and electrical ageing in pulsed RF

Hichame Maanane, Malek Masmoudi, J. Marcon et al. · Microelectronics Reliability · 2005 · 18 citations

Electrical Engineering, Engineering, Rf Semiconductor +6