IEEE Transactions on Nuclear Science · 1985 · 31 citations · 7 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsRadiation PhysicsSemiconductor DevicesCarrier TransportCmos Circuit DesignRadiation HardeningRadiation ResistanceRadiation SensitivitySemiconductor ReliabilityCmos ReliabilityHot Carrier EffectsHot Carrier InjectionHot-carrier DegradationRadiation EffectsRadiation HardnessRadiation-hard DevicesRadiation-hardened Integrated Circuits
The effects of processing variations on the hot-carrier susceptibility of radiation-hardened CMOS transistors have been examined. It has been determined that many process variations which enhance radiation hardness also reduce hot-carrier-induced device degradation. The interactions of radiation and hot-carrier effects are demonstrated not to be additive.
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