Fu‐Lan Hsu

Relationship between MOSFET degradation and hot-electron-induced interface-state generation

Fu‐Lan Hsu, Simon Tam · IEEE Electron Device Letters · 1984 · 209 citations

Device Modeling, Electrical Engineering, Engineering +11

Structure-enhanced MOSFET degradation due to hot-electron injection

Fu‐Lan Hsu, H.R. Grinolds · IEEE Electron Device Letters · 1984 · 153 citations

Faster Degradation Rate, Electrical Engineering, Engineering +11

Source-and-drain series resistance of LDD MOSFET's

B.J. Sheu, Chenming Hu, P.K. Ko et al. · IEEE Electron Device Letters · 1984 · 95 citations

Ldd Mosfet, Electrical Engineering, Engineering +7

Temperature dependence of hot-electron-induced degradation in MOSFET's

Fu‐Lan Hsu, K.Y. Chiu · IEEE Electron Device Letters · 1984 · 86 citations

Semiconductor Technology, Electrical Engineering, Engineering +12

VIA-4 avalanche-induced breakdown mechanisms in short-channel MOSFETs

Fu‐Lan Hsu, P.K. Ko, Simon Tam et al. · IEEE Transactions on Electron Devices · 1982 · 60 citations

Electrical Engineering, Short-channel Mosfets, Engineering +5