Concepedia

Fu‐Lan Hsu

FH

Statistics

Publications

26

Citations

1.3K

H-Index

21

Active since

1982

Affiliations

National Taiwan University(Current)

Taiwan Forestry Research Institute

Hewlett-Packard (United States)

University of California, Berkeley

Council of Agriculture

Fu‐Lan Hsu is an author at National Taiwan University specializing in engineering, semiconductor devices, and electrical engineering.

Publications per year

1982–2021

26

Publications

26

Relationship between MOSFET degradation and hot-electron-induced interface-state generation

Fu‐Lan Hsu, Simon Tam · IEEE Electron Device Letters · 1984 · 210 citations

Engineering, Electrical Engineering, Materials Science +17

Structure-enhanced MOSFET degradation due to hot-electron injection

Fu‐Lan Hsu, H.R. Grinolds · IEEE Electron Device Letters · 1984 · 153 citations

Engineering, Electrical Engineering, Electronic Materials +16

Source-and-drain series resistance of LDD MOSFET's

B.J. Sheu, Chenming Hu, P.K. Ko et al. · IEEE Electron Device Letters · 1984 · 96 citations

Engineering, Electrical Engineering, Circuit Theory +13

Temperature dependence of hot-electron-induced degradation in MOSFET's

Fu‐Lan Hsu, K.Y. Chiu · IEEE Electron Device Letters · 1984 · 87 citations

Engineering, Electrical Engineering, Microelectronics +16

VIA-4 avalanche-induced breakdown mechanisms in short-channel MOSFETs

Fu‐Lan Hsu, P.K. Ko, Simon Tam et al. · IEEE Transactions on Electron Devices · 1982 · 60 citations

Engineering, Computer Engineering, Electrical Engineering +14

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