K.Y. Chiu

Temperature dependence of hot-electron-induced degradation in MOSFET's

Fu‐Lan Hsu, K.Y. Chiu · IEEE Electron Device Letters · 1984 · 87 citations

Engineering, Electrical Engineering, Microelectronics +16

A bird's beak free local oxidation technology feasible for VLSI circuits fabrication

K.Y. Chiu, J.L. Moll, J. Manoliu · IEEE Transactions on Electron Devices · 1982 · 84 citations

Engineering, Computer Engineering, Electrical Engineering +16

Evaluation of LDD MOSFET's based on hot-electron-induced degradation

Fu‐Lan Hsu, K.Y. Chiu · IEEE Electron Device Letters · 1984 · 50 citations

Engineering, Electrical Engineering, Electronic Materials +15

The sloped-wall SWAMI—A defect-free zero bird's-beak local oxidation process for scaled VLSI technology

K.Y. Chiu, J.L. Moll, Kit Man Cham et al. · IEEE Transactions on Electron Devices · 1983 · 37 citations

Engineering, Computer Engineering, Electrical Engineering +15

HPSAC—A silicided amorphous-silicon contact and interconnect technology for VLSI

S.S. Wong, D.C. Chen, Paul Merchant et al. · IEEE Transactions on Electron Devices · 1987 · 30 citations

Engineering, Computer Engineering, Electrical Engineering +17