2010 · 25 citations · 6 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsDevice CharacterizationHigh-temperature MaterialsSemiconductor Device MaterialsWide Band Gap SemiconductorsWide-bandgap Semiconductor DevicesWide-bandgap SemiconductorsHigh-temperature Device OperationHigh-temperature ElectronicsJunction ResistancePower Electronics DevicesSilicon CarbideSilicon Carbide (Sic) MaterialsSilicon Carbide Power DevicesSilicon Carbide Power Electronics
The high current SiC MOSFETs and high-temperature operation IPM with SiC MOSFETs were fabricated. 300A switching in inductive load circuits was performed using a single chip SiC trench MOSFET. And 250°C (the junction temperature of SiC DMOSFETs) operation of SiC IPMs with a new high-temperature bonding method and high-temperature materials (case, encapsulation) was successfully performed.
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Status and prospects for SiC power MOSFETs
James A. Cooper, M. R. Melloch, Ranbir Singh et al. · IEEE Transactions on Electron Devices · 2002 · 498 citations
Hiroshi Fujiwara, Tsunenobu Kimoto, T Tojo et al. · Applied Physics Letters · 2005 · 155 citations · Full text
Shoichi Onda, Rajesh Kumar, K. Hara · physica status solidi (a) · 1997 · 80 citations
Engineering, Electrical Engineering, Materials Engineering +17