Microelectronics Journal · 2008 · 22 citations · 7 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSurface ScienceDevice ModelingDevice SimulationSemiconductor Device MaterialsSemiconductor InterfacesSemiconductor PhysicsSemiconductor SurfacesCharge TrapsCurrent CollapseField-effect Transistor SimulationGallium Nitride (Gan) MaterialsHydrodynamic Device ModelingPhysics-based Device ModelingSemiconductor Device ModelingTraps
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Growth and passivation of AlGaN/GaN heterostructures
J. R. Shealy, T. Prunty, Eduardo M. Chumbes et al. · Journal of Crystal Growth · 2003 · 72 citations