Concepedia

Investigation on the SEL Sensitive Depth of an SRAM Using Linear and Two-Photon Absorption Laser Testing

E. Faraud, V. Pouget, Kai Shao, Camille Larue, F. Darracq, D. Lewis, A. Samaras, F. Bezerra, E. Lorfèvre, R. Ecoffet

IEEE Transactions on Nuclear Science · 2011 · 34 citations · 12 references

Abstract

Linear and two-photon laser testing is used to investigate the single-event latchup sensitive depth of SRAM CY7C1069 embedded in CARMEN satellite experiment. Results are discussed and compared with heavy ion and flight data.

References

12

Knife-edge scanning measurements of subwavelength focused light beams

A. H. Firester, M. E. Heller, Ping Sheng · Applied Optics · 1977 · 147 citations

Engineering, Light Beams, Microscopy +19

Three-dimensional mapping of single-event effects using two photon absorption

Dale McMorrow, William T. Lotshaw, Joseph S. Melinger et al. · IEEE Transactions on Nuclear Science · 2003 · 119 citations

Photonics, Electrical Engineering, Carrier Generation +15

Latchup in CMOS Devices from Heavy Ions

Kamal A. Soliman, D. K. Nichols · IEEE Transactions on Nuclear Science · 1983 · 47 citations

Low-power Electronics, Hardware Security, Electrical Engineering +13

Laser SEL Sensitivity Mapping of SRAM Cells

Andrew J. Burnell, Andrew Michael Chugg, R. Harboe-Sørensen · IEEE Transactions on Nuclear Science · 2010 · 35 citations

Sel Specifications, Sram Cells, Optical Engineering +16

Mechanisms and Temperature Dependence of Single Event Latchup Observed in a CMOS Readout Integrated Circuit From 16–300 K

Cheryl J. Marshall, Paul W. Marshall, Raymond L. Ladbury et al. · IEEE Transactions on Nuclear Science · 2010 · 27 citations

Sel Cross Section, Electrical Engineering, Ion Implantation +14

Investigation on the SEL Sensitive Depth of an SRAM Using Linear and Two-Photon Absorption Laser Testing

Concepts

Abstract

References