Dynamic laser stimulation techniques for advanced failure analysis and design debug applications

High spatial resolution subsurface microscopy

S. B. Ippolito, Bennett B. Goldberg, M. Selim Ünlü · Applied Physics Letters · 2001 · 175 citations · Full text

Engineering, Electrical Engineering, Optics +12

Critical timing analysis in microprocessors using near-ir laser assisted device alteration (lada)

Jeremy Rowlette, Travis M. Eiles · 2004 · 90 citations

Engineering, Computer Engineering, Computer Science +16

Soft Defect Localization (SDL) on ICs

Michael R. Bruce, Victoria J. Bruce, David Eppes et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2002 · 73 citations

Engineering, Computer Engineering, Electrical Engineering +17

Time-Resolved Scanning of Integrated Circuits With a Pulsed Laser: Application to Transient Fault Injection in an ADC

V. Pouget, D. Lewis, P. Fouillat · IEEE Transactions on Instrumentation and Measurement · 2004 · 46 citations

Engineering, Computer Engineering, Electrical Engineering +17

Resistive Interconnection Localization

Edward I. Cole, Paiboon Tangyunyong, C.F. Hawkins et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2001 · 35 citations

Engineering, Electrical Engineering, Electronic Materials +14