Edward I. Cole

Ozone–isoprene reactions: Product formation and aerosol potential

Richard M. Kamens, M.W. Gery, Harvey E. Jeffries et al. · International Journal of Chemical Kinetics · 1982 · 140 citations

Engineering, Atmospheric Photochemistry, Air Quality +17

Backside localization of open and shorted IC interconnections

Edward I. Cole, Paiboon Tangyunyong, Daniel L. Barton · 1998 · 76 citations

3D Ic Architecture, Electrical Engineering, Wafer Scale Processing +15

Soft Defect Localization (SDL) on ICs

Michael R. Bruce, Victoria J. Bruce, David Eppes et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2002 · 73 citations

Hardware Security, Engineering, Electronic Design Automation +12

Novel failure analysis techniques using photon probing with a scanning optical microscope

Edward I. Cole, J.M. Soden, J. L. Rife et al. · 1994 · 66 citations

Photonic Sensor, Engineering, Microscopy +24

TIVA and SEI developments for enhanced front and backside interconnection failure analysis

Edward I. Cole, Paiboon Tangyunyong, David A. Benson et al. · Microelectronics Reliability · 1999 · 56 citations

Electrical Engineering, Reliability Engineering, Engineering +7