Concepedia

David Eppes

DE

2

Publications

93

Citations

2

H-Index

2002

Active since

Affiliations

University of New Mexico(Current)

Advanced Micro Devices (United States)

Sandia National Laboratories

David Eppes is an author at University of New Mexico specializing in defect tolerance, applied physics, and microfabrication.

Top concepts

MicroscopyEngineeringApplied PhysicsDefect ToleranceMicroelectronicsMicrofabricationComputer EngineeringHardware SecurityIntegrated CircuitsComputer Architecture

Publications per year

2002–2004

2

Publications

2

Soft Defect Localization (SDL) on ICs

Michael R. Bruce, Victoria J. Bruce, David Eppes et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2002 · 73 citations

Hardware Security, Engineering, Electronic Design Automation +12

Soft defect localization (SDL) in integrated circuits using laser scanning microscopy

Mike Bruce, Victoria J. Bruce, David Eppes et al. · 2004 · 20 citations

Defect Tolerance, Wafer Scale Processing, Engineering +12

Rows per page

1–2 of 2