Critical timing analysis in microprocessors using near-ir laser assisted device alteration (lada)

Clock generation and distribution for the first IA-64 microprocessor

Simon Tam, Stefan Rusu, Utpal Desai et al. · IEEE Journal of Solid-State Circuits · 2000 · 260 citations

Engineering, Computer Engineering, Electrical Engineering +17

A 90 nm logic technology featuring 50 nm strained silicon channel transistors, 7 layers of Cu interconnects, low k ILD, and 1 μm/sup 2/ SRAM cell

Scott E. Thompson, N. Anand, M Armstrong et al. · 2003 · 243 citations

Engineering, Computer Engineering, Electrical Engineering +17

Debug methodology for the McKinley processor

D. Josephson, S. Poehhnan, V. Govan · 2002 · 133 citations

Engineering, Computer Engineering, Electrical Engineering +8

A technique for fault diagnosis of defects in scan chains

Ruifeng Guo · 2002 · 130 citations

Engineering, Computer Engineering, Computer Systems +13

Backside localization of open and shorted IC interconnections

Edward I. Cole, Paiboon Tangyunyong, Daniel L. Barton · 1998 · 76 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17