Concepedia

Device Failure Analysis

Device Failure Analysis is a systematic investigative method within the domain of device maintenance that identifies, characterizes, and traces the root causes of operational malfunctions or breakdowns in technical systems to inform corrective and preventive strategies.

359

Publications

12.8K

Citations

1.5K

Authors

484

Institutions

Publications per year

2017–2026

72

Parents

Publications

359

A Multicenter Retrospective Study of the Clinical Results of the LINK®SB CharitéA Intervertebral Prosthesis. The Initial European Experience

Steven L. Griffith, Alexis Shelokov, Karin Büttner-Janz et al. · Spine · 1994 · 238 citations

, , +13

A realistic fault model and test algorithms for static random access memories

R. Dekker, F. P. M. Beenker, L. Thijssen · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1990 · 237 citations

, , +16

Reliability and Complications of 500 Consecutive Cochlear Implantations

F. Venail, Marielle Sicard, Jean Pierre Piron et al. · Archives of Otolaryngology - Head and Neck Surgery · 2008 · 215 citations

, , +16

Fault modeling and test algorithm development for static random access memories

R. Dekker, F. P. M. Beenker, L. Thijssen · 2003 · 183 citations

, , +17

Results of an aortic endograft trial: Impact of device failure beyond 12 months

Hugh G. Beebe, Jack L. Cronenwett, Barry T. Katzen et al. · Journal of Vascular Surgery · 2001 · 179 citations · Full text

, , +14

1–5 of 359

Authors

1.5K

  1. JS
    J.M. Soden

    Sandia National Laboratories, United States

    7 publications · 269 citations

    7

    h-index

  2. CM
    Claire M. Rickard

    Griffith University, Australia

    4 publications · 184 citations

    4

    h-index

  3. RE
    Richard E. Anderson

    University of Colorado Boulder, United States

    4 publications · 142 citations

    4

    h-index

  4. SK
    Steven Kasapi

    Nvidia (United States), United States

    4 publications · 92 citations

    4

    h-index

  5. JT
    J.L. Titus

    Naval Surface Warfare Center, United States

    4 publications · 78 citations

    4

    h-index

1–5 of 1.5K

Institutions

484

  1. IBM (United States)

    Armonk, United States

    12 h-index

    31 publications

    1.2K citations

  2. Sandia National Laboratories

    Albuquerque, United States

    8 h-index

    23 publications

    1K citations

  3. Infineon Technologies (Germany)

    Munich, Germany

    6 h-index

    14 publications

    175 citations

  4. Sandia National Laboratories California

    Livermore, United States

    6 h-index

    11 publications

    366 citations

  5. University of Naples Federico II

    Naples, Italy

    6 h-index

    23 publications

    1.2K citations

  6. Samsung (South Korea)

    Seoul, South Korea

    5 h-index

    14 publications

    348 citations

  7. Texas Instruments (United States)

    Dallas, United States

    5 h-index

    13 publications

    181 citations

  8. Stanford University

    Stanford, United States

    5 h-index

    14 publications

    281 citations

1–8 of 484

Venues

  1. IEEE Transactions on Electron Devices

    12 publications · 616 citations

    12

    h-index

  2. IEEE Transactions on Nuclear Science

    11 publications · 358 citations

    11

    h-index

  3. Microelectronics Reliability

    11 publications · 483 citations

    11

    h-index

  4. 10

    h-index

  5. Otology & Neurotology

    8 publications · 534 citations

    8

    h-index

1–5