R. Dekker

A realistic fault model and test algorithms for static random access memories

R. Dekker, F. P. M. Beenker, L. Thijssen · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1990 · 235 citations

Engineering, Mem Testing, Computer Architecture +21

Fault modeling and test algorithm development for static random access memories

R. Dekker, F. P. M. Beenker, L. Thijssen · 2003 · 182 citations

Test Algorithm Development, Engineering, Emerging Memory Technology +23

A cohesive XFEM model for simulating fatigue crack growth under mixed‐mode loading and overloading

R. Dekker, F.P. van der Meer, Johan Maljaars et al. · International Journal for Numerical Methods in Engineering · 2019 · 51 citations · Full text

Cohesive Xfem Model, Engineering, Fracture Optimization +21

A realistic self-test machine for static random access memories

R. Dekker, F. P. M. Beenker, L. Thijssen · 2003 · 43 citations

Engineering, Memory Design, Mem Testing +20

Realistic built-in self-test for static RAMs

R. Dekker, F. P. M. Beenker, L. Thijssen · IEEE Design & Test of Computers · 1989 · 42 citations

Embedded Srams, Engineering, Mem Testing +20