F. P. M. Beenker

A realistic fault model and test algorithms for static random access memories

R. Dekker, F. P. M. Beenker, L. Thijssen · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1990 · 235 citations

Engineering, Mem Testing, Computer Architecture +21

Fault modeling and test algorithm development for static random access memories

R. Dekker, F. P. M. Beenker, L. Thijssen · 2003 · 182 citations

Test Algorithm Development, Engineering, Emerging Memory Technology +23

Macro Testing: Unifying IC And Board Test

F. P. M. Beenker, K.j.e. Van Eerdewijk, R.B.W. Gerritsen et al. · IEEE Design & Test of Computers · 1986 · 87 citations

Engineering, Verification, Computer Architecture +18

Macro Testability; The Results of Production Device Applications

F. Bouwman, S. Oostdijk, R. Stans et al. · 2005 · 46 citations

Engineering, System Testing, Program Analysis +9

A realistic self-test machine for static random access memories

R. Dekker, F. P. M. Beenker, L. Thijssen · 2003 · 43 citations

Engineering, Memory Design, Mem Testing +20