P. Perdu

Influence of Laser Pulse Duration in Single Event Upset Testing

A. Douin, V. Pouget, F. Darracq et al. · IEEE Transactions on Nuclear Science · 2006 · 45 citations

Engineering, Electrical Engineering, Physics +15

Analysis of traps effect on AlGaN/GaN HEMT by luminescence techniques

Mohsine Bouya, N. Malbert, Nathalie Labat et al. · Microelectronics Reliability · 2008 · 33 citations

Engineering, Electrical Engineering, Materials Science +15

Dynamic Thermal Laser Stimulation Theory and Applications

K. Sanchez, R. Desplats, F. Beaudoin et al. · 2006 · 28 citations

Engineering, Electrical Engineering, Heat Transfer +12

Failure analysis of micro-heating elements suspended on thin membranes

D. Briand, F. Beaudoin, J. Courbat et al. · Microelectronics Reliability · 2005 · 27 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +16

Oxide charge measurements in EEPROM devices

Christophe De Nardi, R. Desplats, P. Perdu et al. · Microelectronics Reliability · 2005 · 23 citations

Engineering, Computer Engineering, Electrical Engineering +14