A novel hetero-junction Tunnel-FET using Semiconducting silicide–Silicon contact and its scalability

Yan Wu, Hiroyuki Hasegawa, Kuniyuki Kakushima, Kenji Ohmori, Takanobu Watanabe, Akira Nishiyama, Nobuyuki Sugii, Hitoshi Wakabayashi, Kazuo Tsutsui, Yoshinori Kataoka,

Microelectronics Reliability · 2014 · 28 citations · 23 references

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