Analysis of HBM ESD testers and specifications using a fourth‐order lumped element model

Abstract

Abstract This paper presents the general and analytical solution of a fourth‐order lumped element model (LEM) to describe human body model (HBM) electrostatic discharge (ESD) testers including the main tester parasitic elements. The analytical fitting to the LEM of experimentally obtained HBM pulse data is a new scientifically justified tool to determine HBM tester parasitic elements. The impact of the test board capacitance on HBM testing is demonstrated and explained. Furthermore, the MIL 883C/3015.7 1 and EOS/ESD S5.1‐1991 2 Standards on HBM testers are evaluated upon their selectivity to the test board capacitance. Finally, recommendations to improve HBM tester specifications regarding their selectivity to the parasitic test board capacitance are formulated