K. Verhaege

TLP calibration, correlation, standards, and new techniques

Jon Barth, K. Verhaege, L. Henry et al. · IEEE Transactions on Electronics Packaging Manufacturing · 2001 · 189 citations

Engineering, Measurement, Measurement Standards (Educational Assessment) +16

Diode-triggered SCR (DTSCR) for RF-ESD protection of BiCMOS SiGe HBTs and CMOS ultra-thin gate oxides

M. Mergens, C. Russ, K. Verhaege et al. · 2004 · 102 citations

Engineering, Vlsi Design, Power Electronics +19

Speed optimized diode-triggered SCR (DTSCR) for RF ESD protection of ultra-sensitive IC nodes in advanced technologies

M. Mergens, C. Russ, K. Verhaege et al. · IEEE Transactions on Device and Materials Reliability · 2005 · 98 citations

Engineering, Radio Frequency, Power Electronics +18

ESD protection solutions for high voltage technologies

B. Keppens, M. Mergens, Cong Son Trinh et al. · 2004 · 74 citations

Electrical Engineering, Esd Protection, Engineering +11

GGSCRs: GGNMOS Triggered silicon controlled rectifiers for ESD protection in deep sub-micron CMOS processes

C. Russ, M. Mergens, K. Verhaege et al. · Electrical Overstress/Electrostatic Discharge Symposium · 2001 · 69 citations

Low-power Electronics, Hardware Security, Electrical Engineering +12