Jon Barth - Concepedia

Author

Jon Barth

Texas Instruments (United States)

Also Known As

J Barth, J. Barth, J.E. Barth, Jon Barth

Publications

500

Citations

H-Index

Concepts

All Affiliations

Texas Instruments (United States)Aptiv (United States)IMEC Aptiv (Italy)Advanced Micro Devices (United States)

About

Jon Barth is an author at Texas Instruments (United States) specializing in engineering, electrical engineering, and electromagnetic compatibility.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	12	12	411
2	Education	6	6	310
3	Computer Engineering	4	4	69
4	Biostatistics	2	2	69
5	Management	1	1	20

Jon Barth

Publications

421

Citations

H-Index

Page 1

	Year	Citations
TLP calibration, correlation, standards, and new techniques Jon Barth, K. Verhaege, L. Henry, IEEE Transactions on Electronics Packaging Manufacturing EngineeringMeasurementMeasurement Standards (Educational Assessment)EducationTransmission System	2001	189
TLP calibration, correlation, standards, and new techniques [ESD test] Jon Barth, K. Verhaege, L. Henry, EngineeringMeasurementEducationTransmission SystemTlp Data	2002	51
Developing a transient induced latch-up standard for testing integrated circuits Mary Alexandria Kelly, L. Henry, Jon Barth, Electrical EngineeringLatch EventEngineeringHardware-in-the-loop SimulationCircuit System	2003	25
Standardization of the transmission line pulse (TLP) methodology for electrostatic discharge (ESD) Steven H. Voldman, R.A. Ashton, Jon Barth, Electrical Overstress/Electrostatic Discharge Symposium Transmission Line PulseElectrical EngineeringEngineeringNondestructive TestingElectrostatic Discharge	2003	21
Metrology and methodology of system level ESD testing D.L. Lin, David Pommerenke, Jon Barth, Electrical EngineeringReliability EngineeringEngineeringSimulator Calibration MethodologySystem Testing	2002	20
Using VFTLP data to design for CDM robustness C. Chu, Antonio Gallerano, J.T. Watt, Electrical EngineeringReliability EngineeringEngineeringCdm RobustnessHigh Speed Measurement	2009	20
The importance of standardizing CDM ESD test head parameters to obtain data correlation L. Henry, Mary Alexandria Kelly, T. Diep, Electrical EngineeringEngineeringPogo Pin DiameterMeasurementCalibration	2002	18
Correlation considerations: Real HBM to TLP and HBM testers Jon Barth, John Richner Microelectronics Reliability ReliabilityEngineeringMeasurementConformance TestingSoftware Testing	2002	17
Voltages before and after current in HBM testers and real HBM Jon Barth, R.A. Ashton, E. Worley, Electrical Overstress/Electrostatic Discharge Symposium Electrical EngineeringHbm TestersEngineeringElectrostatic DischargeUnknown Voltage Rate	2005	14
Charged device model (CDM) metrology: limitations and problems L. Henry, H. Hyatt, Jon Barth, Device ModelingElectrical EngineeringEngineeringBelievable Cdm WaveformsSevere Metrology Problems	2005	12

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