13
Publications
421
Citations
12
H-Index
1998
Active since
Jon Barth is an author at Texas Instruments (United States) specializing in engineering, electrical engineering, and electromagnetic compatibility.
Top concepts
EngineeringElectrical EngineeringElectromagnetic CompatibilityMeasurementInstrumentationEducationCalibrationMicroelectronicsSoftware TestingDesign For Testing
Publications per year
1998–2012
13
13
TLP calibration, correlation, standards, and new techniques [ESD test]
Jon Barth, K. Verhaege, L. Henry et al. · 2002 · 51 citations
Engineering, Measurement, Education +16
Developing a transient induced latch-up standard for testing integrated circuits
Mary Alexandria Kelly, L. Henry, Jon Barth et al. · 2003 · 25 citations
Metrology and methodology of system level ESD testing
D.L. Lin, David Pommerenke, Jon Barth et al. · 2002 · 20 citations
Electrical Engineering, Reliability Engineering, Engineering +13
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