D.L. Lin

From lightning to charged-device model electrostatic discharges

D.L. Lin, T. L. Welsher · Journal of Electrostatics · 1993 · 52 citations

Electrical Engineering, Engineering, Electrostatic Discharge +3

A comparison of electrostatic discharge models and failure signatures for CMOS integrated circuit devices

Mary Alexandria Kelly, G. Servais, T. Diep et al. · 1995 · 40 citations

Circuit Devices, Engineering, Electromagnetic Compatibility +17

ESD sensitivity and VLSI technology trends: thermal breakdown and dielectric breakdown

D.L. Lin · Journal of Electrostatics · 1994 · 32 citations

Electrical Engineering, Engineering, Bias Temperature Instability +10

Thermal breakdown of VLSI by ESD pulses

D.L. Lin · 2002 · 23 citations

Electrical Engineering, Engineering, High Voltage Engineering +14

Metrology and methodology of system level ESD testing

D.L. Lin, David Pommerenke, Jon Barth et al. · 2002 · 20 citations

Electrical Engineering, Reliability Engineering, Engineering +13