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ESD sensitivity and VLSI technology trends: thermal breakdown and dielectric breakdown

Electrical EngineeringEngineeringBias Temperature InstabilityEsd SensitivityTime-dependent Dielectric BreakdownCircuit ReliabilityElectronic PackagingDevice ReliabilityMicroelectronicsDielectric BreakdownVlsi Technology TrendsElectrical InsulationElectromagnetic Compatibility