TLP calibration, correlation, standards, and new techniques [ESD test]

Abstract

This paper describes a constant impedance transmission line pulse system with new measurement capabilities and improved accuracy. The paper enforces a broader look at TLP data, beyond the I-V curves. Accurate TLP measurements and actual TLP/HBM device data are used to demonstrate dV/dt effects and HBM/TLP correlation and miscorrelation. Finally, a calibration method and standard TLP test method are presented for adaptation by the industry. This is necessary to provide correlation and repeatability of experimental data.