Cong Son Trinh

Diode-triggered SCR (DTSCR) for RF-ESD protection of BiCMOS SiGe HBTs and CMOS ultra-thin gate oxides

M. Mergens, C. Russ, K. Verhaege et al. · 2004 · 102 citations

Engineering, Vlsi Design, Power Electronics +19

Speed optimized diode-triggered SCR (DTSCR) for RF ESD protection of ultra-sensitive IC nodes in advanced technologies

M. Mergens, C. Russ, K. Verhaege et al. · IEEE Transactions on Device and Materials Reliability · 2005 · 98 citations

Engineering, Radio Frequency, Power Electronics +18

ESD protection solutions for high voltage technologies

B. Keppens, M. Mergens, Cong Son Trinh et al. · 2004 · 74 citations

Electrical Engineering, Esd Protection, Engineering +11

ESD protection solutions for high voltage technologies

B. Keppens, M. Mergens, Cong Son Trinh et al. · Microelectronics Reliability · 2005 · 25 citations

Electrical Engineering, Engineering, Electrostatic Discharge +6

Active-area-segmentation (AAS) technique for compact, ESD robust, fully silicided NMOS design

B. Keppens, M. Mergens, J. Armer et al. · Electrical Overstress/Electrostatic Discharge Symposium · 2003 · 22 citations

Electrical Engineering, Physical Design (Electronics), Engineering +8