C. Russ

Diode-triggered SCR (DTSCR) for RF-ESD protection of BiCMOS SiGe HBTs and CMOS ultra-thin gate oxides

M. Mergens, C. Russ, K. Verhaege et al. · 2004 · 102 citations

Engineering, Vlsi Design, Power Electronics +19

Speed optimized diode-triggered SCR (DTSCR) for RF ESD protection of ultra-sensitive IC nodes in advanced technologies

M. Mergens, C. Russ, K. Verhaege et al. · IEEE Transactions on Device and Materials Reliability · 2005 · 98 citations

Engineering, Radio Frequency, Power Electronics +18

GGSCRs: GGNMOS Triggered silicon controlled rectifiers for ESD protection in deep sub-micron CMOS processes

C. Russ, M. Mergens, K. Verhaege et al. · Electrical Overstress/Electrostatic Discharge Symposium · 2001 · 69 citations

Low-power Electronics, Hardware Security, Electrical Engineering +12

Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing

C. Russ, Karlheinz Bock, Mahmoud Rasras et al. · 2002 · 55 citations

Electrical Engineering, Non-uniform Triggering, Engineering +11

A compact model for the grounded-gate nMOS behaviour under CDM ESD stress

C. Russ, K. Verhaege, Karlheinz Bock et al. · 2005 · 43 citations

Device Modeling, Electrical Engineering, Cdm Esd Stress +13