Philippe Roussel

Impact of MOSFET gate oxide breakdown on digital circuit operation and reliability

B. Kaczer, R. Degraeve, Mahmoud Rasras et al. · IEEE Transactions on Electron Devices · 2002 · 259 citations

Reliability, Electrical Engineering, Reliability Engineering +14

Sialylation and sulfation of the carbohydrate chains in respiratory mucins from a patient with cystic fibrosis.

Jean‐Marc Lo‐Guidice, Jean-Michel Wieruszeski, Jérôme Lemoine et al. · Journal of Biological Chemistry · 1994 · 146 citations · Full text

Atomic Layer Deposition of Ruthenium with TiN Interface for Sub-10 nm Advanced Interconnects beyond Copper

Liang Wen, Philippe Roussel, Olalla Varela Pedreira et al. · ACS Applied Materials & Interfaces · 2016 · 138 citations

Impact of Wire Geometry on Interconnect <italic>RC</italic> and Circuit Delay

Ivan Ciofi, Antonino Contino, Philippe Roussel et al. · IEEE Transactions on Electron Devices · 2016 · 125 citations

3D Ic Architecture, Electrical Engineering, Physical Design (Electronics) +13

SiGe Channel Technology: Superior Reliability Toward Ultrathin EOT Devices—Part I: NBTI

J. Franco, B. Kaczer, Philippe Roussel et al. · IEEE Transactions on Electron Devices · 2012 · 102 citations

Reliability, Electrical Engineering, Engineering +14