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Defect reduction and efficiency improvement of near-ultraviolet emitters via laterally overgrown GaN on a GaN/patterned sapphire template
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2006
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Wide-bandgap SemiconductorElectrical EngineeringSolid-state LightingEngineeringShort Wavelength OpticPhysicsApplied PhysicsDefect ReductionEfficiency ImprovementGan Power DeviceEngineering PhysicsCategoryiii-v SemiconductorOptoelectronicsGan/patterned Sapphire Template
Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation D. S. Wuu, W. K. Wang, K. S. Wen, S. C. Huang, S. H. Lin, S. Y. Huang, C. F. Lin, R. H. Horng; Defect reduction and efficiency improvement of near-ultraviolet emitters via laterally overgrown GaN on a GaN/patterned sapphire template. Appl. Phys. Lett. 16 October 2006; 89 (16): 161105. https://doi.org/10.1063/1.2363148 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioApplied Physics Letters Search Advanced Search |Citation Search
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