Y. E. Strausser

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Publications

Citations

1.2K

H-Index

Active since

1969

Affiliations

Varian Medical Systems (United States)(Current)

Stanford University

Digital Wave (United States)

Pennsylvania State University

Hewlett-Packard (United States)

Y. E. Strausser is an author at Varian Medical Systems (United States) specializing in materials science, natural sciences, and materials engineering.

Publications per year

1969–2002

Publications

Scanning capacitance microscopy imaging of threading dislocations in GaN films grown on (0001) sapphire by metalorganic chemical vapor deposition

P. Hansen, Y. E. Strausser, Andrew Erickson et al. · Applied Physics Letters · 1998 · 263 citations

Engineering, Materials Engineering, Materials Science +17

An Auger analysis of the SiO2-Si interface

J. S. Johannessen, W. E. Spicer, Y. E. Strausser · Journal of Applied Physics · 1976 · 260 citations

Natural Sciences, Chemistry, Materials Science +16

Correlation of real time spectroellipsometry and atomic force microscopy measurements of surface roughness on amorphous semiconductor thin films

Joohyun Koh, Yiwei Lu, C. R. Wroński et al. · Applied Physics Letters · 1996 · 102 citations

Engineering, Materials Science, Physics +17

Observation of an intermediate chemical state of silicon in the Si/SiO2 interface by Auger sputter profiling

C. R. Helms, Y. E. Strausser, W. E. Spicer · Applied Physics Letters · 1978 · 79 citations

Natural Sciences, Chemistry, Materials Science +17

Effects of processing conditions on the growth of nanocrystalline diamond thin films: real time spectroscopic ellipsometry studies

Byungyou Hong, Joungchel Lee, R. W. Collins et al. · Diamond and Related Materials · 1997 · 56 citations

Natural Sciences, Materials Engineering, Materials Science +14

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