C. R. Helms

The silicon-silicon dioxide system: Its microstructure and imperfections

C. R. Helms, Edward H. Poindexter · Reports on Progress in Physics · 1994 · 406 citations

Materials Science, Materials Engineering, Microstructural Features +15

Dopant segregation in polycrystalline silicon

Mohammad M. Mandurah, Krishna C. Saraswat, C. R. Helms et al. · Journal of Applied Physics · 1980 · 370 citations

Materials Science, Semiconductors, Electronic Devices +12

Analyzing atomic force microscopy images using spectral methods

S. Fang, S. Haplepete, W. Chen et al. · Journal of Applied Physics · 1997 · 147 citations

Typical Afm, Engineering, Microscopy +16

Observation of a Change in the Surface Electronic Structure of Pt(100) Induced by Reconstruction

H.P. Bonzel, C. R. Helms, S. R. Kelemen · Physical Review Letters · 1975 · 133 citations

Materials Science, Surface Characterization, Engineering +15

Silicide and Schottky barrier formation in the Ti-Si and the Ti-SiO<i>x</i> -Si systems

Marc A. Taubenblatt, C. R. Helms · Journal of Applied Physics · 1982 · 125 citations

Semiconductors, Materials Science, High Temperature Materials +12