Statistics
Publications
1
Citations
147
H-Index
1
Active since
1997
Affiliations
Texas Instruments (United States)(Current)
S. Haplepete is an author at Texas Instruments (United States) specializing in instrumentation, microscopy, and applied physics.
Publications per year
1997–1997
1
1
Analyzing atomic force microscopy images using spectral methods
S. Fang, S. Haplepete, W. Chen et al. · Journal of Applied Physics · 1997 · 147 citations
Typical Afm, Engineering, Microscopy +16
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