Statistics
Publications
1
Citations
149
H-Index
1
Active since
1997
Affiliations
Texas Instruments (United States)(Current)
S. Haplepete is an author at Texas Instruments (United States) specializing in surface image analysis, power spectral density analysis, and power spectral density.
Publications per year
1997–1997
1
1
Analyzing atomic force microscopy images using spectral methods
S. Fang, S. Haplepete, W. Chen et al. · Journal of Applied Physics · 1997 · 149 citations
Natural Sciences, Materials Science, Materials Characterization +16
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