Statistics
Publications
2
Citations
180
H-Index
2
Active since
1997
W. Chen is an author at Texas Instruments (United States) specializing in surface roughness, materials science, and surface science.
Publications per year
1997–1997
2
2
Analyzing atomic force microscopy images using spectral methods
S. Fang, S. Haplepete, W. Chen et al. · Journal of Applied Physics · 1997 · 149 citations
Natural Sciences, Materials Science, Materials Characterization +16
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