Joungchel Lee

Rotating-compensator multichannel ellipsometry: Applications for real time Stokes vector spectroscopy of thin film growth

Joungchel Lee, P. I. Rovira, Ilsin An et al. · Review of Scientific Instruments · 1998 · 206 citations · Full text

Natural Sciences, Materials Science, Physics +15

Advances in multichannel spectroscopic ellipsometry

R. W. Collins, Ilsin An, Hiroyuki Fujiwara et al. · Thin Solid Films · 1998 · 82 citations

Natural Sciences, Chemistry, Physics +7

Effects of processing conditions on the growth of nanocrystalline diamond thin films: real time spectroscopic ellipsometry studies

Byungyou Hong, Joungchel Lee, R. W. Collins et al. · Diamond and Related Materials · 1997 · 56 citations

Natural Sciences, Materials Engineering, Materials Science +14

Nucleation and bulk film growth kinetics of nanocrystalline diamond prepared by microwave plasma-enhanced chemical vapor deposition on silicon substrates

Joungchel Lee, Byungyou Hong, R. Messier et al. · Applied Physics Letters · 1996 · 48 citations

Natural Sciences, Materials Engineering, Materials Science +17

Dual rotating-compensator multichannel ellipsometer: Instrument development for high-speed Mueller matrix spectroscopy of surfaces and thin films

Joungchel Lee, Joohyun Koh, R. W. Collins · Review of Scientific Instruments · 2001 · 47 citations

Natural Sciences, Materials Engineering, Materials Science +16