Ilsin An

Rotating-compensator multichannel ellipsometry: Applications for real time Stokes vector spectroscopy of thin film growth

Joungchel Lee, P. I. Rovira, Ilsin An et al. · Review of Scientific Instruments · 1998 · 206 citations · Full text

Natural Sciences, Materials Science, Physics +15

Evolution of the optical functions of thin-film aluminum: A real-time spectroscopic ellipsometry study

Hien V. Nguyen, Ilsin An, R. W. Collins · Physical review. B, Condensed matter · 1993 · 85 citations

Natural Sciences, Materials Science, Physics +17

Advances in multichannel spectroscopic ellipsometry

R. W. Collins, Ilsin An, Hiroyuki Fujiwara et al. · Thin Solid Films · 1998 · 82 citations

Natural Sciences, Chemistry, Physics +7

Conduction mechanism of leakage current due to the traps in ZrO₂thin film

Yohan Seo, Sangyouk Lee, Ilsin An et al. · Semiconductor Science and Technology · 2009 · 71 citations

Natural Sciences, Materials Engineering, Materials Science +17

Multichannel Mueller matrix ellipsometer based on the dual rotating compensator principle

Chi Chen, Ilsin An, G.M. Ferreira et al. · Thin Solid Films · 2004 · 70 citations

Engineering, Electrical Engineering, Optoelectronics +10